Universal Non-Volatile Resistive Switching Behavior in 2D Metal Dichalcogenides Featuring Unique Conductive-Point Random Access Memory Effect

Xiaohan Wu,Ruijing Ge,Yuclian Gu,Emmanuel Okogbue,Jianping Shi,Abhay Shivayogimath,Peter Boggild,Timothy J. Booth,Yanfeng Zhang,Yeonwoong Jung,Jack C. Lee,Deji Akinwande
DOI: https://doi.org/10.1109/edtm50988.2021.9420947
2021-01-01
Abstract:Two-dimensional materials have been discovered to exhibit non-volatile resistive switching (NVRS) phenomenon. In our work, we reported the universal NVRS behavior in a dozen metal dichalcogenides, featuring low switching voltage, large on/off ratio, fast switching speed and forming free characteristics. A unique conductive-point random access memory (CPRAM) effect is used to explain the switching mechanisms, supported by experimental results from current-sweep measurements.
What problem does this paper attempt to address?