Thermal noise in contact atomic force microscopy

Chengfu Ma,Chenggang Zhou,Jinlan Peng,Yuhang Chen,Walter Arnold,Jiaru Chu
DOI: https://doi.org/10.1063/5.0054256
IF: 2.877
2021-01-01
Journal of Applied Physics
Abstract:As one of the fundamental sources of noise in atomic force microscopy (AFM), thermal fluctuations of the cantilever have been studied for the case of a free tip but not much for cantilevers in contact. In this paper, using the equipartition theorem, we calculated the thermal deflection amplitude for all normal modes of an elastically supported AFM cantilever, including the free cantilever as a special case. With increasing contact stiffness, the mean thermal fluctuation amplitude decreases for all cantilever modes when in the elastic contact. In addition, considering the optical lever detection scheme used in most AFMs, we calculated the corresponding output thermal noise amplitude. The experiments validated our theoretical calculations. Our investigation facilitates a more comprehensive understanding of the thermal noise in AFM. It provides guidance for thermally excited contact-resonance AFM, which is promising for quantitative viscoelastic measurements.
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