Phase-Shifting Point Diffraction Interferometer Over A Wide Range Of Wavelengths

Xd Han,Cy Han,D Xu,H Ai
2004-01-01
Abstract:Common-path and phase-shifting point diffraction interferometer (PDI) is studied. This interferometer is useful for accurate wave-front measurement over a wide spectral range from visible light to soft X-rays. This testing method can be used in the interference testing for the microscope, projection lithography and the telescope optical system. This interferometer can be used in at-wavelength testing of many optical systems. The reference wave-front is generate by diffraction from a tiny pinhole and the system does not require reference surfaces or long coherence lengths. Amplitude gratings are used to get phase shifted interference patterns with Doppler effect. The transverse displacement of the grating is controlled by the closed loop servo-drive controlling system and the nanometer resolution displacement measuring system with large density single grating. With the several interference patterns we can use the multi step phase-shifting arithmetic to get the phase of the measured wave and achieve the interferential test of the optical system. The error factors. influencing the wave-front measurement precision are analyzed.
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