Highly Selective Microcantilever Sensor For Cesium Ion Detection

T Thundat,E Finot,Hf Ji,R Dabestani,Pf Britt,Pv Bonnesen,Gm Brown,Rj Warmack
1999-01-01
Abstract:We have developed an extremely sensitive and highly selective microcantilever sensor for detecting cesium ions. This sensor concept is based an chemically modifying microcantilevers with ion-selective self-assembled monolayers (SAMs). Microcantilevers undergo bending due to molecular adsorption if the molecular adsorption is confined to a single surface of the microcantilever. This cantilever bending is due to a differential surface stress caused by the forces involved in the adsorption process. Chemical modification of the cantilevers was achieved by a SAM consisting of 1,3-alternate calix[4]-crown-6 (receptor) and two alkyl thiol side chains. It was found that this SAM coated microcantilever could detect cesium ion concentrations in the range 10(-11) - 10(-2) M. In addition, we have also demonstrated that this microcantilever can selectively respond to very small concentrations of Cs+ ions (e.g. 10(-9) M) even in the presence of high concentrations of other alkali metal ions (10(-3)M of K+).
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