Noise Analyzing Of Piezoresistive Silicon Materials

Xm Yu,T Li,Dc Zhang
2004-01-01
Abstract:A good cantilever should possess a small minimum detectable deflection (MDD), which depends on the measurement sensitivity and noise. Although increasing the measurement sensitivity can decrease the NOD of a cantilever, the noise will be a mainly limited factor when the measurement sensitivity is further increased. Therefore, the noise analyses of piezoresistive cantilever are very important in improving cantilever resolutions. In this paper we analyze the noise characteristics of three silicon materials based on a large number of noise measurement results, which show that the 1/f noise is the dominant noise source at low frequencies and noise at high frequencies is Johnson noise. With the linear relation between 1/f noise and 1/L (piezoresistor length), Hooge factor alpha of three materials was calculated. Optimized piezoresistor dimensions for piezoresistive cantilever are given at last.
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