Bloch Wave Treatment Of Symmetry And Multiple Beam Cases In Reflection High-Energy Electron-Diffraction And Reflection Electron-Microscopy
L M Peng,K Gjønnes,J Gjønnes
DOI: https://doi.org/10.1002/jemt.1070200407
1992-01-01
Microscopy Research and Technique
Abstract:Bloch wave equations for the multiple beam cases in reflection high energy electron diffraction (RHEED) are derived from the integral equation by forward- and back-scattering Green function operators. A linearization is achieved through separation in a forward- and a back-scattering component for each beam. This leads to a set of fundamental equations similar to the transmission case, but with a non-Hermitian matrix, and the beams may be entered as either forward-, back-scattered, or both. The number of beams needed to be included in RHEED calculations is thus reduced, and so are the computing time and computer space required. The systematic row case, corresponding to reflections from planes parallel to the crystal surface, is treated in detail and illustrated by calculations of dispersion surfaces and rocking curves for Au(001). Symmetry relations for the systematic row and between reciprocal rows are discussed and illustrated.