Design of the Synchrotron Light Spot Measurement System Based on Fresnel Zone Plate

Sanshuang Jin,Baogen Sun,Jigang Wang,Yunkun Zhao,Fangfang Wu,Ping Lu,Tianyu Zhou

DOI: https://doi.org/10.1117/12.2579504

2020-01-01

Abstract:It is well-known that the synchrotron radiation light source (SRLS) possesses the unparalleled superior characteristic compared with other light sources. Therefore, the investigation and development of the advanced SRLS has always been a major international hotspot. At the same time, there are more and more researcher are actively devoted to construct the new generation of light source in China. For example, the Hefei Advanced Light Facility (HALF) in University of Science and Technology of China (USTC), etc. For HALF, in order to provide machine researchers and users with an intuitive reflection of the quality of the light source, it is necessary to develop a synchrotron light spot measurement system which is employed for real-time and non-destructive monitoring the synchrotron light spot size. According to the pre-designed parameters of HALF, which corresponding to the characteristic wavelength is 0.5 nm. Obviously, the general optical material cannot be satisfied the imaging requirements in this wavelength. Furthermore, the transverse profile of the synchrotron light spot of HALF is need to be less than 10 mu m, of which puts forward higher resolution requirement for the synchrotron light imaging measurement system. In view of the above-mentioned characteristics, in this paper, we concentrate on improving a monitor based on Fresnel Zone Plate (FZP) for measuring the synchrotron light spot size. In terms of the numerical simulation and theoretical analysis of the diffraction of the light source, it is shown that the simulated results are in good agreement with the pre-designed values.