Automatic Generation Of Minimal Mismatch Layouts For Capacitors Based On Simulated Annealing

L Di,Sq Dong,Xl Hong
2005-01-01
Abstract:Device matching is of utmost importance to high performance analog and RF circuit. Traditionally, common centroid layouts are regarded as the best layout method to reduce mismatch of analog devices with strict matching constraints. Based on simple integral model used to evaluate the characteristic parameter of devices, the above conclusion is correct. But based on more accurate segmented integral model, it is wrong. Our algorithm is based on the segmented integral model and adopts simulated annealing algorithm to obtain minimal mismatch layout for capacitors. The algorithm has been implemented in "C++". Many test cases have been run. Experimental results have demonstrated the effectiveness of the algorithm.
What problem does this paper attempt to address?