The Impact Of Electrical Contacts And Contact-Induced Ultralow Noise Amplitudes In Layered Transistors

Chih-Kai Hsu,Chi-Yi Lin,Wenwu Li,Huabin Sun,Yong Xu,Zhigao Hu,Yuan-Ming Chang,Yuen-Wuu Suen,Yen-Fu Lin
DOI: https://doi.org/10.1088/2053-1583/3/4/045015
IF: 6.861
2016-01-01
2D Materials
Abstract:Electrical contacts made of conducting channels with external circuitry significantly impact electronic performances, in particular for two-dimensional semiconductors. This work presents a systematic study of back-to-back Schottky contacts to a layered compound of semiconducting flakes through static and dynamic electrical measurements and the first demonstration of Schottky barrier-dominated, p-type PbSnS2 field-effect transistors. In the static analysis, the Schottky barrier height of the layered transistors can be modulated by applied electrostatic fields, while the contact-dominated fluctuations render to the 1/f electric noise and induce a normalized noise amplitude in the order of 10(-9)-10(-8). Such an ultralow-noise amplitude, which is never observed in other layered semiconducting transistors, is ascribed to the existence of Schottky barriers. Our experimental results provide a nuanced perspective for advancing the understanding of performance limit with increasing numbers of layers for electronic development.
What problem does this paper attempt to address?