Ionization, Electron Attachment And Drift In Cf(4)

Liu Xueli,Li Xuguang,Xiao Dengming
2008-01-01
Abstract:This paper have measured the density-normalized effective ionization coefficients (alpha-eta)/N, (alpha and eta are the ionization find attachment coefficients, respectively) and the electr-Dn drift velocity V(e) in Carbon tetrafluoride (CF(4)) using a pulsed Townsend technique. The overall density-normalized electric field strength E/N ranged from 50 to 250 Td (1 Td=10(-17) Vcm(2)). From the above plots for (alpha-eta)/N, we have derived the limiting or critical field strength, (E/N)lim approximate to 28 Td, which is the value of E/N at which (alpha-eta)/N=0.
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