An Analytical Method for Optimization of Rf Mems Wafer Level Packaging with Cpw Detuning Consideration

Zheng Wang,Zewen Liu
2009-01-01
Abstract:An analytical solution for detuning effect of CPW with cap wafer by applying the conformal mapping method is presented in the paper. A wafer level packaging structure for RF MEMS devices is optimized with the developed analytical formulas. The cavity depth of 40 mu m is adequate to reduce the detuning of the MEMS circuit to an acceptable level for the 50 Omega CPW on the glass substrate for the glass cap wafer.
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