Abstract:<p>The selection rule for angle-resolved polarized Raman (ARPR) intensity of phonons from standard group-theoretical method in isotropic materials would break down in anisotropic layered materials (ALMs) due to birefringence and linear dichroism effects. The two effects result in depth-dependent polarization and intensity of incident laser and scattered signal inside ALMs and thus make a challenge to predict ARPR intensity at any laser incidence direction. Herein, taking in-plane anisotropic black phosphorus as a prototype, we developed a so-called birefringence-linear-dichroism (BLD) model to quantitatively understand its ARPR intensity at both normal and oblique laser incidences by the same set of real Raman tensors for certain laser excitation. No fitting parameter is needed, once birefringence and linear dichroism effects are considered with the complex refractive indexes. An approach was proposed to experimentally determine real Raman tensor and complex refractive indexes, respectively, from the relative Raman intensity along its principle axes and incident-angle resolved reflectivity by Fresnel<span class="math"><math>′</math></span>s law. The results suggest that the previously reported ARPR intensity of ultrathin ALM flakes deposited on a multilayered substrate at normal laser incidence can be also understood based on the BLD model by considering the depth-dependent polarization and intensity of incident laser and scattered Raman signal induced by both birefringence and linear dichroism effects within ALM flakes and the interference effects in the multilayered structures, which are dependent on the excitation wavelength, thickness of ALM flakes and dielectric layers of the substrate. This work can be generally applicable to any opaque anisotropic crystals, offering a promising route to predict and manipulate the polarized behaviors of related phonons.</p>

Unambiguous determination of crystal orientation in black phosphorus by angle-resolved polarized Raman spectroscopy

Identifying the Crystalline Orientation of Black Phosphorus Using Angle-Resolved Polarized Raman Spectroscopy.

In-Plane Uniaxial Strain in Black Phosphorus Enables the Identification of Crystalline Orientation.

Quantitatively predicting angle-resolved polarized Raman intensity of black phosphorus flakes

A Unified Prediction Strategy for Angle‐Resolved Polarized Raman Response of Black Phosphorus

Understanding angle-resolved polarized Raman scattering from black phosphorus at normal and oblique laser incidences

Study of Black Phosphorus Using Angle-Resolved Polarized Raman Spectroscopy with 442 nm Excitation

Lattice Vibration and Raman Scattering in Anisotropic Black Phosphorus Crystals

Discerning Black Phosphorus Crystal Orientation and Anisotropy by Polarized Reflectance Measurement.

Birefringence-Directed Raman Selection Rules in 2D Black Phosphorus Crystals.

Probing The An Isotropic Behaviors Of Black Phosphorus By Transmission Electron Microscopy, Angular-Dependent Raman Spectra, And Electronic Transport Measurements

Direct Observation of Symmetry-Dependent Electron-Phonon Coupling in Black Phosphorus

Optical Anisotropy of Few-Layer Black Phosphorus Visualized by Scanning Polarization Modulation Microscopy

Hunting for Monolayer Black Phosphorus with Photoluminescence Microscopy

Piezoelectric substrate-induced strain engineering on tuning polarized Raman spectra of crystalline black phosphorus

Angular resolved ultra-low frequency Raman spectroscopy of few-layer black phosphorous

Direct Investigation of the Birefringent Optical Properties of Black Phosphorus with Picosecond Interferometry

Remarkable Anisotropic Phonon Response in Uniaxially Strained Few-Layer Black Phosphorus

Raman Spectroscopy Studies of Black Phosphorus.

Universal Paradigm of Raman Anisotropy: the Case of Birefringent TiS₃

Resolving and Tuning Mechanical Anisotropy in Black Phosphorus via Nanomechanical Multimode Resonance Spectromicroscopy