Abstract:<p>The selection rule for angle-resolved polarized Raman (ARPR) intensity of phonons from standard group-theoretical method in isotropic materials would break down in anisotropic layered materials (ALMs) due to birefringence and linear dichroism effects. The two effects result in depth-dependent polarization and intensity of incident laser and scattered signal inside ALMs and thus make a challenge to predict ARPR intensity at any laser incidence direction. Herein, taking in-plane anisotropic black phosphorus as a prototype, we developed a so-called birefringence-linear-dichroism (BLD) model to quantitatively understand its ARPR intensity at both normal and oblique laser incidences by the same set of real Raman tensors for certain laser excitation. No fitting parameter is needed, once birefringence and linear dichroism effects are considered with the complex refractive indexes. An approach was proposed to experimentally determine real Raman tensor and complex refractive indexes, respectively, from the relative Raman intensity along its principle axes and incident-angle resolved reflectivity by Fresnel<span class="math"><math>′</math></span>s law. The results suggest that the previously reported ARPR intensity of ultrathin ALM flakes deposited on a multilayered substrate at normal laser incidence can be also understood based on the BLD model by considering the depth-dependent polarization and intensity of incident laser and scattered Raman signal induced by both birefringence and linear dichroism effects within ALM flakes and the interference effects in the multilayered structures, which are dependent on the excitation wavelength, thickness of ALM flakes and dielectric layers of the substrate. This work can be generally applicable to any opaque anisotropic crystals, offering a promising route to predict and manipulate the polarized behaviors of related phonons.</p>

Discerning Black Phosphorus Crystal Orientation and Anisotropy by Polarized Reflectance Measurement.

In-Plane Uniaxial Strain in Black Phosphorus Enables the Identification of Crystalline Orientation.

Resolving and Tuning Mechanical Anisotropy in Black Phosphorus via Nanomechanical Multimode Resonance Spectromicroscopy

Identifying the Crystalline Orientation of Black Phosphorus Using Angle-Resolved Polarized Raman Spectroscopy.

Probing The An Isotropic Behaviors Of Black Phosphorus By Transmission Electron Microscopy, Angular-Dependent Raman Spectra, And Electronic Transport Measurements

Cover Feature: Identifying the Crystalline Orientation of Black Phosphorus by Using Optothermal Raman Spectroscopy (chemphyschem 20/2017)

Optical Anisotropy of Black Phosphorus in the Visible Regime

Study of Black Phosphorus Using Angle-Resolved Polarized Raman Spectroscopy with 442 nm Excitation

Understanding angle-resolved polarized Raman scattering from black phosphorus at normal and oblique laser incidences

Hunting for Monolayer Black Phosphorus with Photoluminescence Microscopy

Optical Phase Anisotropy In Layered Black Phosphorus

Fast Identification of the Crystallographic Orientation of Violet Phosphorus Nanoflakes with Preferred In‐Plane Cleavage Edge Orientation

Quantitatively predicting angle-resolved polarized Raman intensity of black phosphorus flakes

Nano-imaging of the edge-dependent optical polarization anisotropy of black phosphorus

Anisotropic In-Plane Thermal Conductivity Observed in Few-Layer Black Phosphorus

Investigation of Black Phosphorus As a Nano-Optical Polarization Element by Polarized Raman Spectroscopy

Polarization-sensitive Broadband Photodetector Using a Black Phosphorus Vertical P–n Junction

Tuning Two-Dimensional Hyperbolic Plasmons in Black Phosphorus

Design of black phosphorus 2D nanomechanical resonators by exploiting the intrinsic mechanical anisotropy

Rediscovering Black Phosphorus: A Unique Anisotropic 2D Material for Optoelectronics and Electronics

Dichroic Photoelasticity In Black Phosphorus Revealed By Ultrafast Coherent Phonon Dynamics