Nonmagnetic bimetallic strip driver used in transmission electron microscope

Xiaodong Han,Pan Liu,Yuefei Zhang,Qingsong Deng,Ze Zhang
2009-01-01
Abstract:The invention relates to a nonmagnetic bimetallic strip driver used in a transmission electron microscope, which comprises a nonmagnetic signal metallic strip, a nonmagnetic bimetallic strip and a heat conducting metal frame and is characterized in that the nonmagnetic bimetallic strip formed by a nonmagnetic metallic strip with small linear expansion coefficients and a nonmagnetic metallic strip with big linear expansion coefficients is fixed above the heat conducting metal frame; the nonmagnetic signal metallic strip is positioned between the two nonmagnetic metallic strips; nanophase materials are positioned above the nonmagnetic bimetallic strip and placed into the transmission electron microscope to be heated, and then the nonmagnetic bimetallic strip deforms to drive the nanophase materials to deform. The driver excludes the influence of the magnetism of the bimetallic strip on the nanophase materials in the transmission electron microscope and can conveniently and fast obtain the atomic size information of the nanophase materials.
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