A Method for Performance Degradation Recognition of RF Electronic System on CHMM

Jinze Jiang,Cunbao Ma,Yi Li,Huimin Liu,Jingyu Wang
DOI: https://doi.org/10.1109/IAEAC50856.2021.9390666
2021-01-01
Abstract:As the critical part of radio frequency circuit, radio frequency amplifier has gotten wide attention with the continuous improvement of safety and reliability requirements. For the sake of ensuring the safety of RF electronic system and realizing condition-based maintenance, the degradation state of it should be accurately identified. Based on the S-parameters of RF amplifier, the working performance of RF low noise amplifier is analyzed. In this paper, a continuous hidden Markov model (CHMM) is developed to identify different degradation states of RF circuit. After research, it is found that CHMM can be modeled by the strict data structure and reliable statistical information with dynamic characteristics. Compared with some traditional state recognition methods that stay in static analysis, CHMM can better retain the statistical information of sample data and has higher recognition rate.
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