Abstract:A new, dynamic behavioral modeling technique, based on a time-delay support vector regression (SVR) method, is presented in this paper. As an advanced machine learning algorithm, the SVR method provides an effective option for behavioral modeling of radio frequency (RF) power amplifiers (PAs), taking into account the effects of both device nonlinearity and memory. The basic theory of the proposed modeling technique is given, along with a detailed model extraction procedure. Unlike traditional artificial neural network (ANN) techniques, which take time to determine the best configuration of the model, the SVR method can obtain the optimal model in short time, using the grid-search technique. An example of an optimal SVR model selection applied to an RF PA is also given; the performance of the selected model presents a big improvement when compared with the default SVR model. Experimental validation is performed using an LDMOS PA, a single device gallium nitride (GaN) PA, and a Doherty GaN PA, revealing that the new modeling methodology provides very efficient and extremely accurate prediction. Compared with traditional Volterra models, canonical piecewise linear models, and ANN-based models, the proposed SVR model gives improved performance with reasonable complexity. In addition, it is shown that the model can predict accurately the behavior of the PA under input power levels that are different from those under which it is extracted.

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