Abstract:In order to design and build computers that achieve and sustain high performance, it is essential that reliability issues be considered care fully. The problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte gritted circuits, it is necessary to analyze how decisions regarding design rules affect the yield, i.e., the percentage of functional chips obtained by the manufacturing process. Of equal importance in producing reliable computers is the detection of failures in its Very Large Scale Integrated (VLSI) circuit components, caused by errors in the design specification, implementation, or manufacturing processes. Design verification involves the checking of the specification of a design for correctness prior to carrying out an implementation. Implementation verification ensures that the manual design or automatic synthesis process is correct, i.e., the mask-level description correctly implements the specification. Manufacture test involves the checking of the complex fabrication process for correctness, i.e., ensuring that there are no manufacturing defects in the integrated circuit. It should be noted that all the above verification mechanisms deal not only with verifying the functionality of the integrated circuit but also its performance.

Soft Error Reliability Evaluation of Combinational Logic Element

Combinational Equivalence Checking Based on Circuit Topology Analysis

Application Specified Soft-Error Failure Rate Analysis Using Sequential Equivalence Checking Techniques

Soft Error Generation Analysis In Combinational Logic Circuits

Efficient reliability evaluation of combinational and sequential logic circuits

Combining Model Checking and Testing with an Application to Reliability Prediction and Distribution

Wafer Level Reliability Evaluation of Gate Oxide for Advanced CMOS Process

A new reliability evaluation method for embedded system

Approaches of Error Diagnosis and Correction in Combinational Circuits

BEC: Bit-Level Static Analysis for Reliability against Soft Errors

A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology

Sequential Logic Testing and Verification

A New Family of Sequential Elements with Built-in Soft Error Tolerance for Dual-VDD Systems

Software fault diagnosis method based on combinatorial testing

Statistical Analysis of Soft Error Rate in Digital Logic Design Including Process Variations

Using Formal Verification to Evaluate Single Event Upsets in a RISC-V Core

An Efficient Sequential Equivalence Checking Framework Using Boolean Satisfiability

A Cycle-Accurate Soft Error Vulnerability Analysis Framework for FPGA-based Designs

Design and Verification of Universal Evaluation System for Single Event Effect Sensitivity Measurement in Very-Large-scale Integrated Circuits

Equivalence Checking Using Independent Cuts

A Novel Soft Error Immunity SRAM Cell