Large-signal Characterization and Modeling for Microwave Field-Plate GaN HEMTs

WANG Chang-si,XU Yue-hang,WEN Zhang,CHEN Zhi-kai,ZHAO Xiao-dong,XU Rui-min
DOI: https://doi.org/10.3969/j.issn.1001-0548.2017.03.002
2017-01-01
Abstract:An electro-thermal large-signal model including a nonlinear thermal network for Gallium Nitride high electron mobility transistors (GaN HEMTs) with gate and source field plates is presented in this paper.This model including the nonlinear thermal network with respect to power dissipation is embedded in the improved Angelov model.Based on the electro-thermal principle,the thermal resistance and capacitance for the two field plates of the devices are identified by utilizing the electro-thermal finite element method (FEM) simulations.And the characteristics of small signal and load impedance for the two devices with different field plates have been analyzed in microwave frequency range.Accurate predictions of the quiescent currents,S-parameters up to 40 GHz,and large-signal harmonic performance for the devices with different gate peripheries have been achieved by the proposed model.
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