Dilute Systems and Amorphous Alloys Studied by XAFS

韦世强,张新夷,刘文汉
DOI: https://doi.org/10.3969/j.issn.0253-2778.2001.03.004
2001-01-01
Abstract:Fluorescence and transmission XAFS measurements by highbrilliance synchrotron radiation were described in detail. In order to show their powerful capacities on the structural studies of condensed matters, the surface-sensitive fluorescence XAFS with a grazing incidence, fluorescence XAFS with a normal incidence and in situ transmission XAFS were used to characterize the local structures of the (Ge4Si4)5 monolayer strained-layer superlattice, Ga(Ge,As)/Si(001) dilute impurities and evolutions of ultrafine amorphous NiB alloys during the annealed crystallization process, respectively.
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