Research of Plane Wafer Stage's 6-DOF Ultra-preci-sion Displacement Measurement

Jinchun Hu,Rong Chen,Yu Zhu,Zhenyu Gao
DOI: https://doi.org/10.3969/j.issn.1009-2412.2013.04.003
2013-01-01
Abstract:Wafer stage is one of the core subsystems of lithog-raphy , which directly determines lithography's critical dimension , overlay accuracy and productivity .6-DOF ultra-precision displacement's measurement technique is one of the core techniques for dynamic accuracy's a-chievement of wafer stage , in which the computational error caused by multiple DOF's nonlinear coupling is one core scientific issue . For the demand of wafer stage's ultra-precision displacement's accuracy and fast computation , this paper carried out research in the are-as of , and resolved the problem of computational error in 6-DOF ultra-precision dynamic displacements .
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