Two Models of Nanoleakage Expression in the Self-etching Adhesives

赵三军,陈吉华,熊宇,方明
DOI: https://doi.org/10.3969/j.issn.1671-7651.2005.02.004
2005-01-01
Abstract:Objective: The purpose of this study was to evaluate the dentin nanoleakage in the 3 self-etching adhesives (Clearfil TM SE Bond, Adper TM Prompt TM , PANAVIA TM F). Methods: Superficial occlusal dentin of 12 molars extracted freshly was finished with 600-grit SiC paper under running water. 3 self-etching adhesives were applied to dentin surfaces according to the manufacturers' instructions. The bonded teeth were sectioned occluso-gingivally into 0.9-mm-thick serial slabs which were stored in silver nitrate group or ammoniacal silver nitrate group in the dark for 24 h and prepared for transmission electron microscope. Rusults: With conventional silver nitrate and ammoniacal silver nitrate, the reticular and spotted pattern modes of nanoleakage were observed within thybrid layers of resin-dentin interfaces bonded with 3 self-etching adhesives under TEM. Conclusion: The nanoleakage expression of resin-dentin interfaces was all observed diversely in the self-etching adhesives because of their properties of composition.
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