The Thickness of Large Thin-wall Components On-line Measurement Based on Binocular Structured Light

Gen GUO,Jun-tong XI,Xiao-bo CHEN
DOI: https://doi.org/10.13462/j.cnki.mmtamt.2018.03.018
2018-01-01
Abstract:Large thin-wall components on-line measurement is one of the most important methods to ensure the manufacturing precision of large thin-wall components and to improve the quality and security of the products. The large thin-wall components on-line measurement based on binocular structured light combines binocular measurement and structured light measurement. The thickness of the thin-wall components is indi-rectly measured by selecting a datum plane and the data is merged by coordinate transformation to the turnta-ble frame and combining the corner information. The on-line system is designed and applied by deploying the measurement and machining processes. It makes a great improvement and effect in large thin-wall com-ponents on-line measurement shown by the experiment result.
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