Simulation Analysis of Dark Current in Long Wavelength Infrared HgCdTe Photodiodes

Long LI,Hao SUN,Xian ZHU
2014-01-01
Abstract:The dark current of n-on-p type LWIR based on Hg1-xCdxTe has been simulated in this paper. Different mechanisms influences dark current are also analyzed. The results of the simulation match well with the experiments. The photodetector has a dark current Idark=9×1010 A,working resistance Rr=109?, and quality factors R0A=20?cm2. According to the results,with the present technique,Shockley-Read-Hall (SRH) recombination and surface leakage current are the most influential extrinsic factors to the dark current. The recombination rate of SRH can be as high as 2×1016/s?cm3. And the device will have a severe surface channel when the surface states reaches 1×1012 cm-2.
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