Influence of defect levels in short wavelength Hg1-xCdxTe photodiodes on the performance of device

Xinwen Hu,Xiang Li,Qin Wang,Huiqin Lu,Jun Zhao,Jiaxiong Fang,Shengkun Zhang
1999-01-01
Abstract:The defect levels in the Hg1-xCdxTe (x=0.6) n+-on-p junction photodiodes were investigated by using the admittance spectroscopy, and the measurement results show that the detect level is located at 0.15 eV above the valence band, the trap density NT=6.5×1015 cm-3, and the majority carrier capture cross section is 2.9×10-18 cm2. It is estimated that this kind of defects is related with the Hg vacancy or some composite defects related to it. The minority lifetime of device τpo was calculated as 4.2 ns based on the parameters of deep energy level, and the product Ro·A (area times the dynamic resistance at zero bias) was calculated as 8.76×104 ω·cm2. Besides, the difference between the calculated and measured one was also discussed.
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