High-Responsivity ZnS Schottky Barrier Photodiode Array for Ultraviolet Imaging

Shen Dake,HAN Gaorong,S.Y.Au,Ge Weikun,I.K.Sou
DOI: https://doi.org/10.3969/j.issn.1674-4926.2002.08.020
2002-01-01
Chinese Journal of Semiconductors
Abstract:A different approach,using the molecular beam epitaxy (MBE)-grown ZnS-based Schottky photodiode technology,is applied to fabricate an 8×8 photodiode array.The micro-processing procedures of this photodiode array including standard photolithography,a number of metallisation,wet-chemical etching and SiO2 deposition for insulation are developed.The detector is characterized to have a cutoff wavelength at 340 nm and the photo-responsivity measurements on the pixels result an ultraviolet (UV) response as high as 0.15 A/W,corresponding to an external quantum efficiency of 55% in the visible-blind spectral ranging from 400 down to 250nm.Imaging tests indicate that this array is able to capture the intensity profile of a given UV light source with reasonably good capability.
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