Relations Between Deep Traps and EPIR Effect in La0.5Ca0.5MnO3 Ceramic

WU Meiling,YANG Changping,SHI Dawei,WANG Ruilong,XIAO Haibo,YANG Fujun,WANG Hao,Vyacheslav Marchenkov

DOI: https://doi.org/10.7521/j.issn.0454-5648.2013.12.05

2013-01-01

Abstract:La0.5Ca0.5MnO3 (LCMO) ceramic samples were synthesized by a solid-state sintering method. The transport properties, especially the electrical pulse induced resistance switching (EPIR) effect and its accompanying memristor behavior, were investigated using 2-wire measurement mode with silver-glue electrode. The EPIR effect was observed at room temperature for the samples, which have superior anti-fatigue properties at the high and low resistance states and maintain for a long time. The value of resistance (R) is cor-related to the polarity and amplitude of pulse. The EPIR occurs at pulse>1.2 V in a width of 0.01 s. The EPIR is in a high resistance state when the pulse is positive, while the EPIR is in a lower resistance state when the pulse is reversed, and the higher and lower resistance states can be switched by changing the polarity of pulse. The R-T measurement shows that the resistance state can be maintained when the temperature decreases to below room temperature. However, the gap between the higher and lower resistance states de-creases with increasing temperature, and the both states are expected to overlap at>600 K. The deep level traps on the surface are the main cause for the EPIR effect, which occurs at the interface between the electrode and the surface of LCMO sample.