History Erase Effect of Real Memristors

Yiran Shen,Guangyi Wang
DOI: https://doi.org/10.3390/electronics10030303
IF: 2.9
2021-01-01
Electronics
Abstract:Different from the static (power-off) nonvolatile property of a memristor, the history erase effect of a memristor is a dynamic characteristic, which means that under the excitation of switching or different signals, the memristor can forget its initial value and reach a unique stable state. The stable state is determined only by the excitation signal and has nothing to do with its initial state. The history erase effect is a desired effect in memristor applications such as memory. It can simplify the complexity of the writing circuit and improve the storage speed. If the memristor's response depends on the initial state, a state reset operation is required before each writing operation. Therefore, it is of great theoretical and practical significance to judge whether the memristor has a history erase effect. Based on the study of the history erase effect of real memristors, this paper focuses on the history erase effect of a Hewlett-Packard (HP) TiO2 memristor and the Self-Directed Channel (SDC) memristor of Knowm Company. The DC and AC responses of the HP TiO2 memristor are given, and it is pointed out that there is no AC history erase effect. However, considering the parasitic memcapacitance effect, it is found that it has the effect. Based on the theoretical model of the SDC memristor, its history erase properties with and without considering parasitic effects are studied. It should be noted that this study method can be useful for other materials such as Al2O3 and MoS2.
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