Abstract:The Topmetal detector, utilized in this investigation, is a direct-type CMOS pixel sensor known for its distinctive feature of employing exposed metal at the top of each pixel to directly capture external charged particles. This method generates electrical signals through the induction of charge. At present, it is mainly used in gas pixel detector(GPD) and particle beam monitoring. In this paper, we present a new front-end design aimed at enhancing the capabilities of the Topmetal pixel detector. The focus is on incorporating a Time-Digital Conversion (TDC) ASIC into the front-end, with the objective of achieving high-precision time measurement in addition to superior position resolution. The function of the TDC is achieved by the two reverse delay chains, 11 edge acquisition circuits Time-to-Amplitude Converter (TAC), analog gate, weight count module, and Wilkinson Analog-to-Digital Converter (ADC). Coarse time measurement is implemented based on a counter with a working frequency of 500 MHz, and fine time measurement is implemented by the combination of TAC and ADC. The design prototype was taped out with the GSMCR130 nm technology. Test results show that this circuit can handle up to 11 consecutive cases, with the minimum time interval of adjacent cases being 500 ps and the bin size up to 2 ps. The time measurement precision is better than 50.3 ps RMS and the PVT(Process Voltage Temperature) robustness of the input delay chain circuit is validated, showing the stable performance of the design.

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