Optimization of the Pulsed Laser Deposition Process of In2O3 Thin Films for Ferroelectric Field Effect Device Applications

Shanghai Institute of Ceramics, Chinese Academy of Sciences,Guo Lei,Yan Jian-Min,Xu Zhi-Xue,Wang Hui,Gao Guan-Yin,Zheng Ren-Kui
DOI: https://doi.org/10.1007/s10854-020-04935-x
2021-01-01
Journal of Materials Science Materials in Electronics
Abstract:A series of In 2 O 3 semiconducting thin films were grown on the ferroelectric 0.71Pb(Mg 1/3 Nb 2/3 )O 3 –0.29PbTiO 3 (111) (PMN–PT) single-crystal substrates in the form of ferroelectric field effect transistor (FeFET) devices by the pulsed laser deposition. The effects of substrate temperature and oxygen pressure on the structural and electrical properties of the In 2 O 3 films are investigated. We find that the substrate temperature and oxygen pressure have great impact on the performance of the In 2 O 3 /PMN–PT FeFETs whose channel resistance could be tuned in a nonvolatile and reversible manner via the ferroelectric polarization switching in the PMN–PT layer. In particular, a significant resistance change of 144% and a carrier density change of 92% are achieved at room temperature for the In 2 O 3 film deposited at 600 °C and 2 Pa oxygen pressure. Our results provide useful deposition parameters for growing epitaxial In 2 O 3 thin films on large lattice-mismatched perovskite substrates and constructing In 2 O 3 thin films based FeFETs for energy-efficient nonvolatile ferroelectric field effect device applications.
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