Bond Characteristics and Microwave Dielectric Properties on Zn3-xCux(BO3)2 Ceramics with Ultralow Dielectric Loss

Qin Zhang,Hua Su,Maofeng Zhong,Yuanxun Li,Xiaoli Tang,Yulan Jing
DOI: https://doi.org/10.1016/j.ceramint.2020.10.007
IF: 5.532
2021-01-01
Ceramics International
Abstract:The crystal structure and microwave dielectric properties of Zn3-xCux(BO3)(2) (x = 0-0.12) ceramics prepared via a traditional solid-state reaction method were investigated by means of X-ray diffraction (XRD) utilizing the Rietveld refinement, complex chemical bond theory, and Raman spectroscopy. XRD showed that all samples were single phase. The samples maintained a low permittivity, even at higher Cu2+ contents, which is conducive to the shortening of signal delay time, and intimately related to the average bond ionicity and Raman shift. Moreover, proper Cu2+ substitution greatly reduced the dielectric loss associated with the lattice energy. Cu2+ entering the lattice optimized the temperature coefficient of resonance frequency (tau(f)) values and improved the temperature stability of samples by affecting the bond energy. Optimal microwave dielectric properties were: epsilon(r) = 6.64, Q x f = 160,887 GHz, tau(f) = -42.76 ppm/degrees C for Zn2.96Cu0.04(BO3)(2) ceramics sintered at 850 degrees C for 3 h, which exhibited good chemical compatibility with silver and are therefore good candidate materials for Low temperature co-fired ceramic applications.
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