Systematic Error Control for Deflectometry with Iterative Reconstruction

Ruiyang Wang,Dahai Li,Xinwei Zhang
DOI: https://doi.org/10.1016/j.measurement.2020.108393
IF: 5.6
2020-01-01
Measurement
Abstract:The slope calculation of phase measuring deflectometry is essentially a problem finding correspondence between camera, screen and reflecting point, while the reflecting point suffers from an ambiguity problem. This problem can be solved using an iterative reconstruction strategy, however, the existence of systematic error in the iteration circle significantly harm the accuracy performance. A linear relation is established to iteratively find the reflecting point according to the reconstructed height, and a systematic error control is integrated into the iteration circle to promote the iterative reconstruction accuracy. A spherical surface measurement is demonstrated. The best fit radius of curvature of the reconstructed height is 0.1 mm apart from the result of a spherometer. A 245.1 nm root mean square (RMS) error is achieved, and with the systematic error control integrated into the iteration circle, the low order systematic error is significantly reduced and the figure result can be further promoted to 37.2 nm RMS error.
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