Analysis of Metal Work-Function Modulation Effect in Reconfigurable Field-Effect Transistor

Xianglong Li,Yabin Sun,Ziyu Liu,Xiaojin Li,Yanling Shi,Teng Wang,Jun Xu
DOI: https://doi.org/10.1109/ted.2020.3007364
IF: 3.1
2020-01-01
IEEE Transactions on Electron Devices
Abstract:Work-function modulation in a reconfigurable field-effect transistor (RFET) is investigated by 3-D TCAD simulations. A significant work-function dependence is found in the critical electrical performances of RFET. The results show that the ON-state drive current I-ON is mainly dominated by the control gate (CG) and source work function, while the OFF-state leakage current I-OFF is dominated by program gate and drain work function. With the work-function regulation, more flexible electrical characteristics among both n- and p-type configurations can be obtained, and an RFET with strict symmetric ON-state current and I-ON/I-OFF ratio, that is, (I-ON)(n) : (I-ON)(p) = (I-OFF)(n) : (I-OFF)(p) = 1 : 1, has been realized in this work. The underlying physical mechanism is explored, and the corresponding performance of the application in logic and memory is discussed. Moreover, the work-function regulation in CG and source can be recognized as an effective method to subtle tweak noise margin of electrical systems.
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