Three-dimensional Measurement System Based on Structured Light and Error Correction

Wenkang Wu,Yongjun Wang,TingTing Yu,Hongyan Zhao,Xinyu Liu,Yucheng Pan,Xiaoyuan Niu,Jun Li,Hui Xu,Xiangjun Xin
DOI: https://doi.org/10.1117/12.2506346
2018-01-01
Abstract:This paper introduces one three-dimensional measurement system which based on structured light. This system has the advantages of high precision, high speed, and simple structure. In the three-dimensional measurement system based on structured light, the solution phase is one of the key steps. Phase jump, shadow and other errors will have a great impact on the final point cloud computing. This paper explains the three-dimensional measurement system, then also made an error analysis and proposed a corresponding solution. The reasons for the phase jump were analyzed and the corresponding solutions were proposed. This paper also analyzes the cause of random error and proposes a solution. The final accuracy was improved. This has important applications in contour extraction in workpiece repair and autopilot.
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