Oxygen In-Diffusion in LPE Thick Films of YBCO by Electrical Resistance Relaxation

H Zhang,X Yao,XH Zeng
DOI: https://doi.org/10.1002/pssa.200306838
2004-01-01
physica status solidi (a)
Abstract:The oxygen in-diffusion in a LPE (liquid phase epitaxy) thick film of YBCO on a MgO substrate has been investigated by the isothermal electrical resistance relaxation. The results show an in-diffusion activation energy, E, of 1.09 eV and a chemical diffusion coefficient (D) over tilde of 10(-10) - 10(-9) cm(2) s(-1) at 425 - 500 degreesC. In comparison with films prepared by conventional vapor deposition, the LPE thick film shows a larger relaxation characteristic time tau and thus needs much more time to be fully oxygenated due to the crystal perfection and longer diffusion distance.
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