Experiment Confirmation of the Inverse Hall-Petch Effect in Al-TiB2 Nanocrystalline Films

Shang Hailong,Ma Bingyang,Li Rongbin,Li Geyang

2019-01-01

Rare Metal Materials and Engineering

Abstract:The effect of grain size in nanocrystalline alloys is difficult to reveal experimentally because of the interaction between a number of other microstructure factors. A series of multilayered films with Al-TiB2 crystalline layers of different thicknesses were prepared which possessed amorphous layers of identical thickness. The results show that in these multilayered films, the heights of columnar crystals in crystalline layers are controlled from 8 to 128 nm and their diameters are maintained at 15 nm, independent of their heights. This design achieved the control of grain size, independent of other microstructure factors. The analyses of mechanical properties of these multilayered films show that the inverse Hall-Petch phenomenon also exists in Al-TiB2 nanocrystalline alloys, as in nanocrystalline pure Al. The critical grain sizes of deviation from the Hall-Petch relationship and the inverse Hall-Petch phenomenon are approximately 32 and 8 nm, respectively. These critical grain sizes are similar to those of nanocrystalline pure Al by molecular dynamic simulations.