The Effect of Fabrication Conditions on 2degs Transport Characteristics at Amorphous-Laalo3/ktao3 Interfaces

Hui Zhang,Xi Yan,Jing Zhang,Jine Zhang,Furong Han,Hailin Huang,Shaojin Qi,Wenxiao Shi,Baogen Shen,Jirong Sun
DOI: https://doi.org/10.1088/2053-1591/ab240a
IF: 2.025
2019-01-01
Materials Research Express
Abstract:Two-dimensional electron gases (2DEGs) formed at the interface between two oxide insulators present a promising platform for the exploration of emergent phenomena. While most of the previous works focused on SrTiO3-based 2DEGs, here we report on a systematic investigation of the 2DEGs at amorphous-LaAlO3/KTaO3 (a-LAO/KTO) interfaces, focusing on the effect of fabrication conditions on 2DEGs. We found that 2DEGs can be formed in a wide temperature range from room temperature to 750 degrees under the oxygen pressure 1 x 10(-4) Pa. Unexpectedly, its performance shows a unusual strong dependence on fabrication temperature: the Hall mobility increases rapidly with the decrease of substrate temperature. The highest extracted mobility of charge carriers coming from d(xz)/d(yz) subband is similar to 6.6 x 10 (3) cm(2) V(-1)s(-1), achieved under the condition of T-s = 100 degrees C and P-O2 = 3 x 10(-5) Pa. This value is higher than that of the 2DEGs of a-LAO/SrTiO3 by a factor of 30, which reveals the unique character of the 2DEGs formed by 5d electrons. Two-band model is applied for the analysis of the transport behavior, from which information on carrier density and Hall mobility and their dependence on fabrication conditions are determined.
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