Study on Impurities of Zngep2 Single Crystal and Its Effect on Infrared Optical Property

Deng-Hui Yang,Bei-Jun Zhao,Bao-Jun Chen,Shi-Fu Zhu,Zhi-Yu He,Zhang-Rui Zhao,Meng-Di Liu
DOI: https://doi.org/10.1088/2053-1591/aa7d29
IF: 2.025
2017-01-01
Materials Research Express
Abstract:X-ray photoelectron spectroscopy (XPS) was proposed as a feasible method to study the impurity phases and their distribution in the ZnGeP2 single crystals grown by Bridgman method while these impurity phases can't be detected by x-ray diffraction (XRD) measurements because of their low content. The quality of ZnGeP2 single crystal were characterized by XRD as well. Optical properties and crystal homogeneity were analyzed by Fourier transform infrared spectrophotometry (FTIR). XPS results manifest that impurities phases of ZnP2 and Zn3P2 exist on the tail of the crystal rather than the main body which result in component inhomogeneity. These impurities lead to a lower IR transmittance of the tail part than that of the main crystal body. The study of impurities and its effect on optical properties provide important reference for optimizing the growth progress and its post heat treatment which can improve the IR transmittance.
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