Growth and Characterization of Sulfur-doped GaSe Single Crystals

Huang Chang-Bao,Ni You-Bao,Wu Hai-Xin,Wang Zhen-You,Xiao Rui-Chun,Qi Ming
DOI: https://doi.org/10.15541/jim20150032
IF: 1.292
2015-01-01
Journal of Inorganic Materials
Abstract:It is difficult to obtain high quality sulfur-doped GaSe single crystal due to the intensive convection and solution diffusion in the melt. High quality GaSe0.89S0.11 single crystal with dimensions of phi 20 mmx60 mm was successfully grown by Bridgman method using modified furnace with crucible rotation technique. The crystal was characterized by using energy dispersive spectrometer, X-ray diffractometer, nanoindentation, and Fourier infrared spectrometer. The measured results indicate that the sulfur-doped GaSe crystal with sulfur level of 2.38wt% shows significantly improved mechanical properties. The infrared transmission tests indicate that it has slightly higher transmittance in the range of 0.62-12.5 mu m than the pure GaSe crystal. The results demonstrate that the modified Bridgman method could be used to produce high quality sulfur-doped GaSe crystals.
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