Structural and optical properties of CdS thin films prepared by RF sputtering

Zhu Yan-Yan,Xu Run,Fanf Ze-Bo
DOI: https://doi.org/10.3724/SP.J.1010.2014.00040
2014-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:Cadmium sulfide thin films were grown on transparent conductive oxide coated glass substrates by radio frequency magnetron sputtering with a substrate temperature ranging from 30 degrees C to 200 degrees CC. X-ray diffraction measurements reveal that cadmium sulfide films were polycrystalline with the hexagonal wurtzite structure. The scanning electron microscope images show a good crystalline quality of the films which can also be confirmed by the Raman spectra, ultraviolet-visible absorption spectra and the photoluminescence spectroscopy. The Raman spectra measurements indicate that the compressive stress in the CdS films increases with increasing growth temperature.
What problem does this paper attempt to address?