Characterization and Stability Monitoring of X-ray Focal Spots

Gabriel M. Probst,Qinhan Hou,Bart Boeckmans,YongShun Xiao,Wim Dewulf
DOI: https://doi.org/10.1016/j.cirp.2020.04.072
IF: 4.482
2020-01-01
CIRP Annals
Abstract:The characteristics of the X-ray focal spot strongly influence XCT image sharpness and structural resolution. However, current international standards only yield a limited characterization of the focal spot as two perpendicular sizes. Therefore, this paper presents a method for full characterization of the focal spot in terms of both 2D shape and intensity distribution, by applying the inverse Radon transform on a radiograph of a Siemens star. The method is validated through simulations and applied experimentally to two XCT sources. Subsequently, an investigation on how the X-ray tube settings influence focal spot size, shape, intensity and stability is presented.
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