Feasibility of Large-Scale MoS2 Thin-Film Transistors on a GaN Substrate

Yang Wang,Zheng-Hao Gu,Hao Liu,Lin Chen,Xin-ke Liu,Long Min,Zhi-wen Li,Hao Zhu,Qing-Qing Sun
DOI: https://doi.org/10.1021/acsaelm.9b00236
IF: 4.494
2019-01-01
ACS Applied Electronic Materials
Abstract:Two-dimensional (2D) materials have attracted much attention for their layered structures and diversity in electronic and optical properties. Sapphire and Si/SiO2 were the most common substrates for chemically synthesized MoS2. Here, we demonstrated high-quality large-scale MoS2 film grown by atomic layer deposition (ALD) on an Fe-doped free-standing GaN substrate. In addition, we fabricated excellent performance and highly uniform top-gate FETs based on MoS2, and the average electron mobility of MoS2 FETs was up to 3.54 cm(2) V-1 s(-1). Furthermore, Al2O3 was introduced to act as a hard mask to prevent direct contact of photoresist and MoS2, which was compatible for the fabrication process and ensured the homogeneity of electrical properties of each FET. Our work paves a new way for chemically synthesized wafer-scale MoS2 film, and it is promising to build large-scale integrated circuits other than FETs on a GaN substrate.
What problem does this paper attempt to address?