Scatter Considerations in Industrial CT

王烈波,刘以农,康克军
DOI: https://doi.org/10.3969/j.issn.0258-0934.2005.01.006
2005-01-01
Abstract:The existence of Compton scatter will lower the performance of ICT system. Scatter may evoke serious high-frequency artifacts near the sharp edge in reconstructed image, and thus influence the detection of defects. We developed a method to theoretically calculate projection error due to X-ray scatter near the boundaries of two different materials, and verified in with Monte Carlo simulation. According to the calculated results, we simply discuss the possible form of resulting high-frequency artifacts.
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