An experimental study of the influence of channel positioning on low-frequency noise in Si 0

M. von Haartman,A.-C. Lindgren,P.-E. Hellberg,S.-L. Zhang,M. Östling
2002-01-01
Abstract:Si0.7Ge0.3 pMOSFETs were shown to exhibit improved low-frequency noise performance as well as enhanced transconductance compared to Si pMOSFETs. The lowfrequency noise was characterized for SiGe pMOSFETs with different Si-cap thicknesses, best performance was achieved for devices with Si-cap thicknesses between 1-3 nm. Short channel SiGe pMOSFETs with gate lengths down to 0.2 μm also had superior low-frequency noise perfomance and enhanced transconductance compared to Si pMOSFETs. However, the transconductance improvement was slightly reduced compared to long channel devices.
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