Etching-free patterning method for electrical characterizations of atomically thin CVD-grown MoSe2 film

M. Iqbal Bakti Utama,Xin Lu,Da Zhan,Son Tung Ha,Yanwen Yuan,Zexiang Shen,Qihua Xiong
2013-01-01
Abstract:Fig. S1 Failure of Aqua Regia etching of MoSe 2 and the possibility of MoSe 2 patterning with metal sacrificial layer. (a,b) Optical micrograph of (a) Bilayer MoSe 2 film sample with metallic structures prior to etching, and (b) MoSe 2 sample after immersion in Aqua Regia for 2 hours. Dashed red squares on both micrographs denotes the same area. Scale bars in (a) and (b): 50 μm. (c) Raman spectra before and after Aqua Regia etching at an area not covered by metallic structures. (d) The same Raman spectra at the low frequency regime.
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