A Measurement of Sin 2 Β from B → J / Ψk 0 S with the CDF Detector

Tony Affolder,H. Akimoto,A. Akopian,M. G. Albrow,P. Amaral,S. R. Amendolia,D. Amidei,J. Antoš,G. Apollinari,T. Arisawa,T. Asakawa,W. Ashmanskas,M. Ataç,Patrizia Azzi,N. Bacchetta,M. W. Bailey,S. Bailey,P. de Barbaro,A. Barbaro‐Galtieri,Virgil E Barnes,B. A. Barnett,M. Barone,G. Bauer,F. Bedeschi,Stefano Belforte,G. Bellettini,J. Bellinger,D. Benjamin,James Bensinger,A. Beretvas,J. P. Berge,J. W. Berryhill,S. Bertolucci,B. Bevensee,A. Bhatti,C. Bigongiari,M. Binkley,D. Bisello,R. E. Blair,C. Blocker,K. Bloom,Barry Blumenfeld,B. S. Blusk,A. Bocci,A. Bodek,W. Bokhari,G. Bolla,Y. Bonushkin,D. Bortoletto,J. Boudreau,A. Brandl,S. van den Brink,C. Bromberg,N. Bruner,E. Buckley‐Geer,J. Budagov,H. S. Budd,K. Burkett,G. Busetto,A. Byon-Wagner,K. L. Byrum,M. Campbell,A. Caner,W. Carithers,J. Carlson,D. Carlsmith,J. Cassada,Andrew John Castro,D. Cauz,A. Cerri,P. Chang,P. T. Chang,J. Chapman,C. Chen,Y. C. Chen,M.-T. Cheng,Maxwell Chertok,G. Chiarelli,И. Чириков-Зорин,G. Chlachidze,Frank Chlebana,L. Christofek,M. L. Chu,S. Cihangir,C. I. Ciobanu,A. Clark,M. Cobal,E. Cocca,A. Connolly,J. Conway,J. Cooper,M. Cordelli,J. Guimarães da Costa,Davide Costanzo,J. Cranshaw,D. Cronin-Hennessy,R. Cropp,R. Culbertson,D. Dagenhart,F. DeJongh,S. Dell’Agnello,M. Dell’Orso,R. Demina,L. Demortier,M. Deninno,P. F. Derwent,T. Devlin,Jay Dittmann,S. Donati,J. Done,Tommaso Dorigo,N. Eddy,K. Einsweiler,J. E. Elias,E. Engels,Wolfram Erdmann,D. Errede,S. Errede,Q. Fan,R. G. Feild,C. Ferretti,I. Fiori,B. Flaugher,G. W. Foster,M. Franklin,J. Freeman,J. Friedman,Y. Fukui,S. Gadomski,S. Galeotti,Michele Gallinaro,Tong Gao,M. Garcia-Sciveres,A. F. Garfinkel,P. Gatti,S. Geer,D. W. Gerdes,P. Giannetti,P. Giromini,V. Glagolev,M. Gold,Joel Goldstein,A. Gordon,A. T. Goshaw,Y. Gotra,K. Goulianos,H. Grassmann,C. Green,L. Groer,C. Grosso-Pilcher,M. Guenther,G. Guillian,R. S. Guo,C. Haber,E. Hafen,S. R. Hahn,C. Hall,T. Handa,R. Handler,W. Hao,F. Happacher,K. Hara,A. D. Hardman,R. M. Harris,Frank Hartmann,Kenichi Hatakeyama,Jay Hauser,J. Heinrich,A. Heiß,B. Hinrichsen,K. D. Hoffman,C. Holck,R. J. Hollebeek,L. Holloway,R. E. Hughes,J. Huston,J. Huth,H. Ikeda,M. Incagli,J. Incandela,G. Introzzi,J. Iwai,Y. Iwata,E. James,H. Jensen,M. Jones,Umesh Joshi,H. Kambara,T. Kamon,T. Kaneko,K. Karr,H. Kasha,Y. Kato,T. A. Keaffaber,K. Kelley,M. Kelly,R. D. Kennedy,R. Kephart,D. Khazins,T. Kikuchi,M. Kirk,B. J. Kim,H. S. Kim,S. H. Kim,Y. K. Kim,L. Kirsch,S. Klimenko,D. Knoblauch,P. Koehn,A. Köngeter,K. Kondo,J. Konigsberg,K. Kordas,Andrey Korytov,E. Kovacs,J. Kroll,Mark Kruse,S. Kuhlmann,K. Kurino,T. Kuwabara,A. T. Laasanen,N. Lai,S. Lami,Stephan Lammel,J. I. Lamoureux,M. Lancaster,G. Latino,T. LeCompte,A. M. Lee,S. Leone,J. D. Lewis,M. Lindgren,T. M. Liss,J. B. Liu,Y. C. Liu,N. S. Lockyer,Owen Rosser Long,M. Loreti,D. Lucchesi,P. Lukens,S. Lusin,J. Lys,R. Madrak,Kaori Maeshima,Petar Maksimović,L. Malferrari,M. Mangano,M. Mariotti,G. Martignon,A. Martín,John Matthews,P. Mazzanti,K. S. McFarland,P. McIntyre,E. McKigney,M. Menguzzato,A. Menzione,E. Meschi,C. Mesropian,C. Miao,T. Miao,R. Miller,J. S. Miller,H. Minato,S. Miscetti,M. Mishina,N. Moggi,E. F. Moore,R. Moore,Y. Morita,A. Mukherjee,Thomas Müller,A. Munar,P. Murat,S. Murgia,M. Musy,Jane Nachtman,Steve Nahn,H. Nakada,T. Nakaya,I. Nakano,Charles A. Nelson,D. Neuberger,C. Newman-Holmes,C.-Y. P. Ngan,P. Nicolaidi,Niu Huang,L. Nodulman,A. Nomerotski,S. H. Oh,T. Ohmoto,T. Ohsugi,R. Oishi,T. Okusawa,J. Olsen,C. Pagliarone,F. Palmonari,R. Paoletti,V. Papadimitriou,S. P. Pappas,A. Parri,D. Partos,J. Patrick,G. Pauletta,M. Paulini,A. Perazzo,L. Pescara,Michael Peters,T. J. Phillips,G. Piacentino,K. Pitts,R. Plunkett,A. Pompoš,L. Pondrom,G. Pope,F. Prokoshin,J. Proudfoot,F. Ptohos,G. Punzi,K. Ragan,D. Reher,A. Ribon,F. Rimondi,Luciano Ristori,W. J. Robertson,A. Robinson,T. Rodrigo,S. Rolli,L. Rosenson,R. Roser,Roberto Rossin,W. K. Sakumoto,David Saltzberg,A. Sansoni,L. Santi,H. Sato,Pierre Savard,P. Schlabach,E. E. Schmidt,M. P. Schmidt,Michael Henry Schmitt,Luca Scodellaro,A. Scott,A. Scribano,S. Segler,Sally Seidel,Y. Seiya,A. Semenov,F. Semeria,T.P. Shah,Marjorie Shapiro,P. F. Shepard,T. Shibayama,M. Shimojima,M. Shochet,J. Siegrist,G. Signorelli,A. Sill,P. Sinervo,P. Singh,A. J. Slaughter,K. Sliwa,Caleb Smith,F. D. Snider,A. Solodsky,J. Spalding,T. Speer,P. Sphicas,F. Spinella,María Spiropúlu,Leonard Spiegel,L. Stančo,J. Steele,A. Stefanini,John Strologas,F. Strumia,David Stuart,K. Sumorok,T. Suzuki,R. Takashima,K. Takikawa,M. Tanaka,T. Takano,B. Tannenbaum,W. Taylor,M. Tecchio,P. K. Teng,Koji Terashi,S. Tether,D. Theriot,R. Thurman-Keup,P. Tipton,S. Tkaczyk,K. Tollefson,A. Tollestrup,H. Toyoda,W. Trischuk,Jorge F de Trocóniz,S. Truitt,J. Tseng,N. Turini,F. Ukegawa,J. Valls,S. Vejcik,G. Velev,R. Vidal,R. Vilar,I. Vologouev,D. Vucinic,R. G. Wagner,R. L. Wagner,J. Wahl,N. B. Wallace,A. M. Walsh,C. Wang,C. H. Wang,M. J. Wang,Takashi Watanabe,T. Watts,R. Webb,H. Wenzel,W. C. Wester,A. B. Wicklund,E. Wicklund,H. H. Williams,P. Wilson,Brian L Winer,D. Winn,S. Wolbers,D. Wolinski,J. Wolinski,Steven Worm,Xin Wu,J. Wyss,Avraham Yagil,Wei-Ming Yao,G. P. Yeh,P. Yeh,J. Yoh,C. Yosef,T. Yoshida,I. Yu,Shin‐Shan Yu,A. Zanetti,F. Zetti,S. Zucchelli
IF: 5.407
2000-01-01
Physical Review D
Abstract:This paper reports an updated measurement of the Standard Model CP violation parameter sin 2β using the CDF Detector at Fermilab. The entire Run I data sample of 110 pb−1 of proton antiproton collisions at √ s = 1.8TeV is used to identify a signal sample of ∼400 B → J/ψK0 S events, where J/ψ → μ+μ− and K0 S → π+π−. The flavor of the neutral B meson is identified at the time of production by combining information from three tagging algorithms: a same-side tag, a jet-charge tag, and a soft-lepton tag. A maximum likelihood fitting method is used to determine sin 2β = 0.79 −0.44 (stat+syst). This value of sin 2β is consistent with the Standard Model prediction, based upon existing measurements, of a large positive CP violating asymmetry in this decay mode. PACS numbers: 12.15.Hh, 13.20.He, 14.40.Nd Typeset using REVTEX
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