3.1.2. X-ray IMAGING at ANKA

D. Pelliccia,A. Rack,S. Bauer,A. Cecilia,L. Helfen,L. Tao,P. Vagovič,F. Xu,L. Zhijuan,A. Minkevich,Ì.,Huber,E. Fohtung,T. Rolo,A. Ershov,T. Baumbach

2008-01-01

Abstract:Synchrotron imaging methods with spatial resolution in the micrometer and nanometer range are increasingly relevant to material research and diagnostics in engineering sciences, micro system and nanotechnologies, to structure imaging in nano-biology and life sciences, to non-destructive testing and geometrical measuring of components and devices, to paleontology, cultural heritage and other fields. Synchrotron imaging methods allow closing the gap between conventional 2D and 3D imaging performed with X-ray table-top sources techniques and electron microscopy methods, i.e. the gap between about 10 μm and several ten nanometers. X-ray imaging techniques are largely non-destructive and allow using and combining various contrast mechanisms (absorption, X-ray fluorescence, Fresnel and Bragg diffraction, dichroism, etc.) to image geometrical, crystallographic and chemical structures of samples. In 2006 the ANKA-IMAGING-group has been established and assigned to push instrumentation and development of components, methods and techniques of X-ray imaging. The group is developing full-field methods of projection imaging, microscopy and 3D tomographic imaging based on absorption, phase and Bragg/Laue diffraction contrast. The main imaging projects for the period from 2008 to 2010 will be the construction and the full operation of TOPO-TOMO and IMAGE beamlines. Both will allow ANKA to cover the resolution range from 40 nm to 40 μm with X-ray energies ranging from approximately 6 to 60 keV.