Abstract:A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend). This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 microm spot of approximately 5x10(9) photons/s (0.1% bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored by two pairs of adjustable slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 microm are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (approximately 0.2 microm) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10(-5) strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (approximately 150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.

Multi-contrast Computed Laminography at ANKA Light Source

Laminographic Imaging Using Synchrotron Radiation - Challenges And Opportunities

Multi-contrast Diffraction Enhanced Computed Laminography at Beijing Synchrotron Radiation Facility.

Nano-Laminography For Three-Dimensional High-Resolution Imaging Of Flat Specimens

3.1.2. X-ray IMAGING at ANKA

X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions

Synchrotron and Neutron Laminography for Three-Dimensional Imaging of Devices and Flat Material Specimens

Optimization of Image Quality and Acquisition Time for Lab-Based X-ray Microtomography Using an Iterative Reconstruction Algorithm

Laboratory x-ray nano-computed tomography for biomedical research

A Versatile High-Speed X-Ray Microscope for Sub-10 Nm Imaging

High-resolution Multicontrast Tomography with an X-ray Microarray Anode-Structured Target Source

Laminography as a tool for imaging large-size samples with high resolution

Extreme Sparse X-ray Computed Laminography Via Convolutional Neural Networks

Synchrotron radiation computed laminography for polymer composite failure studies.

X-Ray Phase Contrast and Fluorescence Nanotomography for Material Studies

Advanced Acquisition Strategies for Lab-Based Diffraction Contrast Tomography

A Dedicated Superbend X-Ray Microdiffraction Beamline for Materials, Geo-, and Environmental Sciences at the Advanced Light Source

Real-time reconstruction and visualisation towards dynamic feedback control during time-resolved tomography experiments at TOMCAT

Laminography as a tool for imaging large‐size samples with high resolution

A Sagittally Focusing Double-Multilayer Monochromator for Ultrafast X-ray Imaging Applications.