Extreme strain rate and temperature dependence of mechanical properties of nano silicon nitride thin layer in basal plane under tension: a molecular dynamics research

Xuefeng Lu,Hongjie Wang,Yin Wei,Jiangbo Wen,Min Niu,Shuhai Jia
2014-01-01
Abstract:Please note that technical editing may introduce minor changes to the text and/or graphics, which may alter content. The journal’s standard Terms & Conditions and the Ethical guidelines still apply. In no event shall the Royal Society of Chemistry be held responsible for any errors or omissions in this Accepted Manuscript or any consequences arising from the use of any information it contains. Accepted Manuscript
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