Aberration Corrected Spin Polarized Low Energy Electron Microscope.

Lei Yu,Weishi Wan,Takanori Koshikawa,Meng Li,Xiaodong Yang,Changxi Zheng,Masahiko Suzuki,Tsuneo Yasue,Xiuguang Jin,Yoshikazu Takeda,Ruud Tromp,Wen-Xin Tang
DOI: https://doi.org/10.1016/j.ultramic.2020.113017
IF: 2.994
2020-01-01
Ultramicroscopy
Abstract:Spin Polarized Low Energy Electron Microscopy (SPLEEM) is a powerful tool to reveal the magnetic structure of ferromagnetic surfaces on the atomic depth scale level[1-3]. With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration corrected SPLEEM (AC-SPLEEM). The performance of the setup was tested on ferromagnetic Fe nanoscale islands on a W(110) single crystal, with spatial resolution of 3.3 nm in spin asymmetry images.
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