Investigation of NbOx-based Volatile Switching Device with Self-Rectifying Characteristics

Yichen Fang,Zongwei Wang,Caidie Cheng,Zhizhen Yu,Teng Zhang,Yuchao Yang,Yimao Cai,Ru Huang
DOI: https://doi.org/10.1007/s11432-019-9894-0
2019-01-01
Science China Information Sciences
Abstract:Conclusion The niobium oxide based nonlinear devices were fabricated and analyzed. The electrical tests present good control over device-to-device variation and stable endurance more than 10(6). The conduction mechanism was comprehensively discussed. The low-voltage region relates to SCLC, while Schottky and F-N tunneling are responsible for negative and positive high-voltage region respectively. Consequently, the volatile switching may originate from the capture and release of electrons by traps in SCLC mechanism, and this relaxation phenomenon is evaluated quantitatively.
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